Scanning atoms with an AFM tip (Newcastle University)
[Application Example] Scan atoms with an integrated micro-cantilever!
The excellent resolution of Atomic Force Microscopy (AFM) is over 1000 times more sensitive than light-based microscopes. Unlike electron microscopes, it can image samples in situ. By combining expertise in mechatronics, MEMS, and low-noise electronic design, we present examples of unique solutions that can reduce the complexity and cost of AFM systems in nanotechnology. *For more details, please refer to the PDF document or feel free to contact us.*
- Company：エレクトロニカIMT事業部
- Price：Other
